DefSim is an integrated circuit (IC) and a proprietary measurement environment for experimental study of CMOS defects. The central element of the DefSim environment is the IC with a large variety of shorts and opens physically inserted into a set of simple digital circuits. The IC is attached to a dedicated measurement box serving as an interface to the computer. The box supports two measurement modes - voltage and IDDQ testing.

The DefSim chip was designed in AMS 0.8µm CMOS (double-metal, double-poly) technology. Prototype chips were manufactured via TIMA-CMP Multi-Project Wafer service. The chip occupies 19.90 mm2 of silicon. It is composed of approx. 48000 transistors, uses 62 pins, and is packaged in JLCC68 package.

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